Asia Symposium on Quality Electronic Design (ASQED)

ASQED 2011 Conference At-a-Glance

Monday, July 18, 2011

6:00pm–8:00pm

Pre-Registration

 

Tuesday, July 19, 2011

8:00am9:00am

Registration

 
9:00am–9:15am

Welcome & Introductionan

Exhibits
Open
9:00am–6:00pm

9:15am–10:00am

Keynote 1P1

Nanotechnology and the Challenges Facing Design of Circuits and Systems

Prof. Arokia Nathan

Chair of Nanotechnology London Centre for Nanotechnology

University College London

10:00am–10:30am Tea Break & Networking
10:30am–11:15am

Keynote 1P2

Electronics for Energy Management

Dr. Bernard Courtois

Director of CMP, and TIMA, France

11:15am–12:00

Keynote 1P3

The Packaging Technology Domain: reflecting the national economic development frontier

Prof. Younggap You

Dean of College of Electrical and Computer Engineering

Chungbuk National University, Korea

12:00–1:30pm

ASQED Lunch Buffet

1:30pm–3:00pm

Session 1A

Advanced Packaging and Signal Integrity

Room: A

Session 1B

Advances in Analog IC Design

Room: B

Session 1C

Low-Cost and Efficient Testing

Room: C

Tutorial T1

Mark Scannell, CEA-Leti, France

Room: D

 

3:00pm–3:30pm

Tea Break and Networking

3:30pm–5:00pm

Session 2A

High Performance Memory and Logic Circuits

Room: A

Session 2B

MEMS and Biochips

Room: B

Session 2C

On-Chip Interconnects and Communication

Room: C

Tutorial T2

John Park,

Mentor Graphics

Room: D

 

5:00pm–6:30pm

Poster Session

Networking and Mixer

Wednesday, July 20, 2011

8:00am-9:30am

Registration
Networking

 
9:30am–10:30am

Keynote 2P1

Challenges in Interconnection

Dr. ChoonHeung Lee

Head of Corp. Technology HQ, Amkor

Exhibits
Open
9:00am–5:00pm
10:30am–11:00am

Tea Break & Networking Session

11:00am–12 Noon

Keynote 2P2

Advances in High Density Interconnections-Promoting Innovations and Lower Costs

Happy Holden

Chief Technical Officer, Foxconn Advanced Technology

12 Noon–1:30pm

Buffet Lunch

1:30pm–3:00pm

Session 3A

Statistical Timing and Leakage Analysis

Room: A

Session 3B

Noise Analysis and Characterization

Room: B

Session 3C

Fault Detection and Correction

Room: C

Tutorial T3

Ilyas Mohammed, Tessera, USA

Room: D

 

3:00pm–3:30pm

Tea Break and Networking Session

3:30pm–5:00pm

Session 4A

Nanoelectronic Devices and Circuits

Room: A

Session 4B

Advanced VLSI Architectures and Applications

Room: B

Session 4C

Sensors and Displays

Room: C

Tutorial T4

Farhang Yazdani, BroadPak, USA

Room: D

 

Thursday, July 21, 2011

9:00am–6:00pm

International Visitors Program

 


Technical Program